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Features
- Michelson
Principle Laser Dilatometer
- Non contact expansion and
shrinkage measurement
- no calibration needed
- Any solid sample material
(reflecting & not reflecting)
- Free choice of sample geometry
- Sample preparation same as with
conventional Dilatometer
- Measurements under inert,
oxid., red., vacuum
- Maximum precision 0,3 Nanometer
- temperature range -180 up to
1600°C*
- Induction and heat resistance
furnace possible
Description
Normally available dilatometers of the series L75 which use the
single/double push rod principle of measurement are successfully available in
the market since 1957. As a further total new development Linseis is now
offering a Laser Dilatometer built after the Michelson-Interferometer
principle.
Unmatched resolution and absolute
accuracy is now possible due to the new development of the Linseis Laser
Dilatometer of the Pico-series. As the name indicates already the resolution
goes up to Picometers (0,3nm = 300 Picometer). That means resolutions can be
obtained which are up to a factor 33,33 higher as the resolution that were
possible up to date. On top the principle of interference measurement give the
possibility for much higher accuracy''s, especially as some special computer
calibrations are used. Up to now absolute accuracy''s of 1% were normal, with
best accuracy''s up to 100nm. The new method allows accuracy''s up to 30nm.
Linseis L75/LASER only needs slight machining
of the sample. All you need to do is just prepare one sample, as with the
conventional push rod type dilatometer. The system does not require any specific
sample geometry. All types of material, reflecting or none reflecting can be
evaluated with the system. The measurement principle is an "absolute
measurement", not like conventional double sample pushrod Dilatometers,
providing much higher precision. No calibration has to be undertake, unlike with
conventional Dilatometers.
Applications
- Precision
measurement of thermal expansion of low expansion materials such as: carbon,
graphite, composites, low expansion glass, amber alloy, quartz glass, etc.
2.
Precision
measurement of thermal expansion of semiconductor materials.
3.
Quality control
and quality inspection of materials of which thermal expansion characteristics
can be a problem, such as glass, sealing materials, bimetals, materials for
precision electronic instruments etc.
Technical specifications Laser
Dilatometer
Sample length: |
20mm
|
Sample Diameter: |
up
to 7mm |
Temperature range: |
-180
up to 1600°C* |
Furnace type: |
induction or heat resistance
|
Heating/cooling rate: |
0.1
up to 100K/s* |
*different furnaces |
|